ACM Research, Inc. today announced that its 18 chamber, 300mm Ultra C VI single wafer cleaning tool has been qualified by a customer and successfully moved to mass production.
Semiconductors
Supplyframe Commodity IQ: Most Electronics Supply Chain Challenges Are Getting Worse
New data from Supplyframe paints a grim picture of current and expected conditions in the electronics supply chain, where commodity supply tightness and cost inflation are impacting most inputs across categories.
A Fast and Accurate Innovative Imaging Technique to Monitor Modern Semiconductor Devices
Researchers at Samsung developed a novel approach to inspect and measure critical dimensions of semiconductor devices, with higher speed and resolution than conventional methods.
Kyocera to Build Its Largest Plant in Japan, Increasing Production of Semiconductor Components
Expanded Sendai Plant Campus in Kagoshima will meet increasing demand for semiconductor packages powering ADAS, sensor cameras, 5G and more.
Breakthrough Performance on Display with GaN Systems at PCIM 2022
GaN Systems, a developer of GaN (gallium nitride) power semiconductors, today announced the key power electronics solutions that will be on display at PCIM Europe 2022 from May 10–12, 2022 in Nuremberg, Germany.
Applied Materials Technologies Enable 2D Scaling with EUV and 3D Gate-All-Around Transistors
Applied Materials, Inc. today introduced innovations that help customers continue 2D scaling with EUV and detailed the industry’s broadest portfolio of technologies for manufacturing next-generation 3D Gate-All-Around transistors.
Counterpoint Research: Global Semiconductor Shortage Likely to Ease Significantly in H2 2022 Despite China Lockdowns
Global semiconductor chip shortages are likely to continue easing during the second half of 2022 as demand-supply gaps decrease across most components, according to Counterpoint Research’s latest smartphone Component Tracker Report.
Triplett Announces EPC600 Environmental Particle Counter for Indoor Air Quality Monitoring
Triplett Test Equipment, a maker of test equipment tools, announces the Triplett Model EPC600 Environmental Particle Counter.
CyberOptics Highlights Best Practices for Detecting Particles in Semiconductor Environments at SPIE Advanced Lithography and Patterning
CyberOptics Corporation will exhibit at SPIE Advanced Lithography and Patterning from April 27-28 at the San Jose Convention Center in California.
Teradyne Marks the 7,000th J750 Semiconductor Test System Shipment with Nations Technologies
Teradyne, Inc., a supplier of automated test equipment, today announced the shipment of the 7,000th unit of its industry-leading J750 semiconductor test platform to Nations Technologies, a leading Chinese microcontroller unit (MCU) and security integrated circuit (IC) chip maker.
