CyberOptics Corporation (NASDAQ: CYBE), a global developer and manufacturer of high-precision 3D sensing technology solutions, will exhibit at SPIE Advanced Lithography and Patterning from April 27-28 at the San Jose Convention Center in California, booth #217. During the show, the company will feature the In-Line Particle Sensor (IPS) and ReticleSense wireless sensors for improved yields and productivity.
An extension of the industry-leading WaferSense and ReticleSense Airborne Particle Sensor (APS) technology that is documented by fabs as the Best Known Method (BKM), the In-Line Particle Sensor (IPS) with CyberSpectrum software detects particles in gas and vacuum lines 24/7. The IPS quickly identifies, monitors and enables troubleshooting of particles down to 0.1µm.
Process and equipment engineers in semiconductor fabs can speed equipment qualification with real-time monitoring, compare past and present data, as well as one tool to another. Contamination sources can be identified quickly and the effects of cleaning, adjustments and repairs can be seen in real-time. Fabs can shorten equipment maintenance cycles, lower equipment expenses and optimize preventative maintenance plans.
CyberOptics will also demonstrate the ReticleSense Airborne Particle Sensor (APSRQ) and the ReticleSense Auto Multi Sensor (AMSR) for wireless leveling, vibration, and relative humidity (RH) measurements.