Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors

Keysight Technologies, Inc. (NYSE: KEYS) introduces a 4881HV High Voltage Wafer Test System expanding its semiconductor test portfolio. The solution improves the productivity of power semiconductor manufacturers by enabling parametric tests up to 3kV supporting high and low-voltage in one-pass test.

Manufacturers have traditionally measured wafers using separate testers for high and low voltages. However, demand for power semiconductors is rapidly growing due to their multifunctionality, higher performance, and next-generation devices such as silicon carbide (SiC) and gallium nitride (GaN). As a result, customers need a solution to more accurately and efficiently test their devices and reduce time to market.

Keysight’s solution addresses these challenges by allowing power device makers to perform process control monitoring (PCM) and wafer acceptance testing (WAT) in manufacturing. The new test system delivers the following benefits:

Shinji Terasawa, Vice President and General Manager of Keysight’s Wafer Test Solutions, said: “Keysight is thrilled to introduce our new wafer test system for power semiconductors, building on our long tenure of testing advanced semiconductors. Our mission is to lead the market by providing cutting-edge solutions that anticipate and meet the rapidly evolving needs of the semiconductor sector. This latest innovation exemplifies our unwavering commitment to the industry.”

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