Marposs Inc. announced the latest addition to its highly successful line of Industry 4.0 metrology solutions, the STIL MICROMEASURE 2 3D Measuring System. The MICROMESURE 2 high-performance 3D measurement system is ideal for non-contact surface measurement, providing exceptional performance across a wide range of metrology uses, including machined parts, electronics, semiconductor and wafer processing, and much more. Its chromatic confocal sensing technology can measure dimensional attributes, surface roughness, three-dimensional shapes and microtopography, and displacement of part features relative to datums and other features, even in challenging materials like glass and polymers.
A member of the MIME family of metrology devices, the new system builds on the success of Marposs STIL’s existing chromatic confocal technology. The MICROMEASURE 2 comes equipped with high-resolution motors in the X, Y, and Z axes, 3D processing software, a computer and programmable motion controller, and three sizes of measurement stage – 100 x 100, 200 x 200, and 300 x 300. It is also compatible with all STIL sensors and controllers, and for more advanced measurements and deeper surface analysis, STIL’s Mountains® software is available.
The result is a metrology solution for the most demanding of applications. Depending on the STIL sensor used, measuring range can be from 150 μm to as much as 30 mm, providing different scales of analysis and a wide array of surface characterizations.
STIL Systems has been a leader in chromatic confocal measurement technology since its founding more than three decades ago. Part of the Marposs Group since 2019 and managed under the company’s TESTAR division, the France-based STIL is known as a pioneer in this demanding market and is recognized by manufacturers worldwide for its high-quality sensing solutions.
