Santec Announces Launch of Swept Photonics Analyzer

Santec Holdings Corporation, a manufacturer of advanced optical components, tunable lasers, optical test equipment, and OCT systems, announces the product launch of the extended range Swept Photonics Analyzer (SPA-110).

Santec Holdings Corporation, a manufacturer of advanced optical components, tunable lasers, optical test equipment, and OCT systems, announces the product launch of the extended range Swept Photonics Analyzer (SPA-110). The SPA-110, in conjunction with Santec’s market leading tunable laser, uses optical frequency domain reflectometry (OFDR) technology to analyze compact fiber optic and photonic devices for insertion loss and return loss with a spatial resolution of better than 5 µm.

The SPA-110 builds on Santec’s predecessor, the SPA-100, by extending the total measurement range from 5 m to 30 m. This increased range accommodates the addition of optical signal conditioning devices, such as polarization controllers and optical switches, within the fiber optic setup. This enhancement makes the system particularly suitable for more comprehensive characterization of small devices like silicon photonic circuits, fiber optic components, and compact fiber optic assemblies.

Furthermore, the extended scan length allows for the analysis of longer fiber optic cable assemblies with closely spaced components, where OTDR technology might struggle to distinguish between them.

Finally, the 80 dB dynamic range during Wavelength Dependent Loss measurement (WDL) make it possible to detect even weaker reflection events.

Features:

30m measurement range makes it ideal for integration into photonics devices testing

systems.

High Spatial Resolution: <5 μm spatial resolution in silicon

Wide Dynamic Range for WDL: better than 80 dB dynamic range for WDL measurements

Auxiliary OPM port: Integrate external OPM to facilitate automated alignment to

waveguide

Configurable: O-band and CL band options

Proximity sensing: Use OFDR technology to sense distance between fiber probe and

wafer

Easy Analysis: Intuitive software to analyze areas of interest, apply di erent refractive

indexes to portions of the scan, measure IL and RL, store/load previous data for further

analysis.

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