Process metrology, failure analysis, and core-structure characterization can be invaluable in accelerating research and development, enhancing yield and improving display quality.
Controlling Polymers to Tune TFTs
Thin-film transistors (TFT) created using only additive process steps could create new low-cost ICs with functionalities beyond silicon, but only if we understand how to control structures at the molecular level. Thin films of conjugated polymers such as poly(3-hexylthiophene) (P3HT)…