ClassOne Equipment announced the sale of its advanced new Takano WM-7SR particle measurement system to the DTU Nanolab at the Technical University of Denmark. The announcement was made by ClassOne Equipment Vice President, David Pawlak, and DTU Nanolab Head of Process Engineering, Flemming Jensen.
“DTU Nanolab chose the Takano WM-7SR particle inspection system specifically to replace an older particle scanner system that was not keeping up with our current needs,” said Jensen. “And because we still had our older particle scanner on hand, we were able to compare it directly with the new Takano system and see the dramatic improvements firsthand. The new WM-7SR now gives us a number of significant advantages, including Windows 10, superior sensitivity, more modern hardware, and a longer life laser diode. Plus, it will require significantly less maintenance.”
Jensen also noted that the new Takano system will be available to outside companies on a pay-per-use basis, as well as to ClassOne Equipment for customer demonstrations.
Pawlak pointed out that ClassOne is seeing dramatically increased sales of the new Takano tools, often because of their value as replacements for legacy particle scanner systems. Attractively priced and readily available, the Takano equipment can deliver best-in-class detection sensitivity along with high throughput and excellent repeatability, as well as a full suite of options.
ClassOne Equipment is the exclusive source for sales, service and complete support of Takano particle detection systems in North America and Europe. ClassOne maintains a team of specially-trained field engineers to provide installations, PMs and all other services on Takano systems.
In addition to the all-new Takano systems, ClassOne Equipment also offers a broad selection of previously-owned semiconductor equipment, including many tools that are totally refurbished and literally better-than-new. The company also provides thousands of top-quality OEM parts, as well as equipment service, support, warranties, financing, and much more.