FormFactor, Inc. (NASDAQ: FORM), a supplier of electrical test and measurement technologies, has introduced the EVOLVITY™ 300, a semi-automated engineering wafer probe system that complements the company’s proven CM300 product line. The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design, developed specifically for RF/DC modeling and device characterization.
While the CM300 is a modular platform adaptable to a wide range of use cases and customer-specific applications, supporting both manual and automated wafer loading, the EVOLVITY 300 includes the most commonly required features as standard, ensuring ease of use and quick deployment. Building on the trusted legacy of the Cascade S300 and Elite systems, the EVOLVITY 300 provides a flexible, space-efficient platform that integrates into existing setups. Its compact design optimizes lab space and enables easy switching between applications such as advanced RF measurements, DC characterization, and probe cards. Additionally, the system offers automation options that simplify operations and provide greater flexibility for users.
“We believe on-wafer testing systems should be as straightforward as possible,” said Jens Klattenhoff, VP and GM of the Systems Business Unit at FormFactor. “That is why we designed the EVOLVITY 300 with ease of use in mind – offering simple configuration, quick setup, and long-term support. Its intuitive interface and streamlined processes reduce setup time and complexity, allowing even less experienced users to focus on testing and development instead of tedious setup work.”
Key Features of the EVOLVITY 300:
- Mechanical Platen Lift: Enhances safety during complex RF set-ups, increasing operator confidence and minimizing the risk of errors.
- Ease-of-use and Advanced Automation: Full compatibility with FormFactor’s Autonomous RF and DC measurement assistants as well as Velox Dash companion app control.
- Reconfigurable Platen Inserts: Quickly switch between TopHat, PCH, and IceShield inserts within minutes to support a wide variety of test configurations.
- Spacious Platen Design: Provides flexibility for both RF and DC setups without space limitations, ensuring easy integration of different configurations.
- Compact Design: Small footprint with field-upgradable components for smooth integration into existing test cells.
